Additional Technical References
Chapter 12: Noise Analysis
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Cong, Jason, et al., "Improved Crosstalk Modeling for Noise Constrained Interconnect Optimization", Proceedings of the 2001 Asia and South Pacific Design Automation Conference (ASP-DAC'01), p. 373 - 378.
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Levy, Rafi, et al., "ClariNet: A noise analysis tool for deep submicron design", Design Automation Conference, 2000, p. 233 - 238.
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Tseng, K., and Kariat, V., "Static noise analysis with noise windows", Design Automation Conference, 2003, p. 864 - 868.
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Ding, Li, et al., "Efficient Crosstalk Noise Modeling Using Aggressor and Tree Reductions", Proceedings of the 2002 IEEE International Conference on Computer-Aided Design (ICCAD), p. 595 - 600.
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Chai, D., et al., "Temporofunctional crosstalk noise analysis", Design Automation Conference 2003, p. 860 - 863.
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Varshney, G.K., et al., "An Efficient Methodology for Noise Characterization", IEEE International Symposium on Quality Electronic Design, 2000, p. 330 - 336.
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Chandrasekar, S., et al., "A Comprehensive Methodology for Noise Characterization of ASIC Cell Libraries", Proceedings of the IEEE Sixth International Symposium on Quality Electronic Design (ISQED), 2005, p. 530-535.
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Papadopoulos, P., et al., "Challenges and Trends in SOC Electromagnetic (EM) Crosstalk", IEEE International Verification and Security Workshop (IVSW), 2017.
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Raman, A., et al., "Electromagnetic (EM) Crosstalk Failures and Symptoms in SoC Designs", IEEE International Workshop on Microprocessor and SoC Test and Verification, 2017.