Additional Technical References

Chapter 21:   Post-silicon Debug and Characterization and Product Qualification

  1. Lin, David, et al., "Quick Error Detection Tests with Fast Runtimes for Effective Post-Silicon Validation and Debug", IEEE Design, Automation, & Test in Europe Conference (DATE), 2015, p. 1168 - 1173.

  2. Wang, M.-Y., et al., "The Effect of FIB Technology on Design Methodology", IEEE Midwest Symposium on Circuits and Systems, 1993, p. 725-728.

© 2019 by Thomas Dillinger